Silicon Wafers and Semiconductor Substrates for Research & Development

Serving researchers, universities, and the semiconductor industry since 1997. No minimum order quantity.

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Below Are Just Some of the Substrates You Can Buy As Few as ONE Online!

In Stock

We Have A Large Selection of Ultra-Flat Silicon Wafers With Total Thickness Variation (TTV) < 1 Micron!

Maximize your lithographic precision and bonding yields with our ultra-flat silicon wafers, engineered with a tight 1-micron Total Thickness Variation (TTV) to meet the rigorous demands of advanced MEMS, SOI, and semiconductor device fabrication.

We Have Extra-Thick Silicon Wafers Up to 10mm

Engineer superior infrared lenses and ultra-stable neutron filters with our extra-thick silicon substrates, available up to 10mm to provide the exceptional structural integrity and optical path length your high-energy applications require.

Thermal Oxide Dry and Wet Up to 15 µm

Accelerate your prototyping with our ready-to-ship silicon wafers featuring precise thermal oxide coatings from 100 nm dry to 15 µm wet, eliminating the long lead times of custom furnace runs.

Ultra-Thin Silicon Wafers

Push the physical limits of semiconductor design with our ultra-thin silicon wafers, precisely thinned and polished to your exact specs to enable breakthrough research in MEMS, optoelectronics, and flexible displays.


150mm Silicon Wafer Sale

Factory sealed, silver wrapped, cassette packs.

  • P/Boron Material: $11.90/wafer
  • Other Materials: $6.90/wafer
  • Dummy Wafers: $4.90/wafer
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Other Substrates And Services That We Provide

Sputtered Thin Films

  • Conductive Metals
  • Aluminum Alloys
  • Adhesion Metals
  • Refractory Metals
  • Platinum Group Metals
  • Magnetic Metals
  • Non-Magnetic Alloys
  • Other Alloys
  • Semiconductors
  • Nitrides
  • Oxides
  • TCO
  • Carbon, Carbide
  • Silicides
  • Chalcogenide

Evaporated Thin Films

  • Conductive Metals
  • Adhesion Metals
  • Refractory Metals
  • Platinum Group Metals
  • Magnetic Metals
  • Non-Magnetic Alloy
  • Soft Metals
  • Semiconductors
  • Oxides
  • TCO
  • Fluorides

Silicon-on-Insulator & SiC Wafer Inventory Buy Online!

SIMOX SOI Wafer Inventory

Device Layer (nm) Box Layer (nm) Handle Layer (um) TTV (um) Qty
55145725+/-15<1184
702000725+/-15<11756
1451000725+/-15<19166
3000300725+/-15<14414

*Selection of available inventory. Contact us for full list.

Silicon Carbide That's Made in USA!

4H-1440 n+ Silicon Carbide Wafer
100mm diameter, 4° off-axis

100mm Wafer Cassette Drawing
Product metric Units Prime Standard Test Grade
Crystal Characteristics
Polytype 4H 4H
Doping Type n-type n-type
Dopant Nitrogen Nitrogen
Surface Orientation degrees 3.8 - 4.2
Wafer Mechanical Characteristics
Diameter mm 99.7 - 100 99.5 - 100
Thickness μm 330 - 370 325 - 375
Primary Flat Position degree ± 1 ± 1
Primary Flat Length mm 31.5 - 34 30.5 - 34.5
Secondary Flat Position mm ± 5 ± 5
Secondary Flat Length mm 17.5 - 19.5 16 - 20
Bow μm ± 20 R
Warp μm ≤ 30 R
Total Thickness Variation (TTV) μm ≤ 5 R
Local Thickness Variation (SBIR) μm ≤ 2 R
Substrate Quality
Resistivity ohm-cm 0.014 - 0.024 0.010 - 0.030
Foreign Polytypes % 0 ≤ 15
Defects (TUA)1 % ≥ 95 nr
Dislocation Distribution2 (EPD) cm-2 ≤ 12,000 nr
TED cm-2 ≤ 9,000 nr
TSD cm-2 ≤ 1,000 nr
BPD cm-2 ≤ 2,000 nr
MPD cm-2 ≤ 0.5 nr
Surface and crystal imperfections cm-2 ≤ 1 na
Hex Plates % 0 nr
Visual Carbon Inclusion % area < 0.05 nr
Visual Edge Inclusions number 0 nr
Visible Scratches mm < 15 nr
Edge Chips and Indents number 0 Yes; not quantified
Cracks number 0 0
Pinholes number 0 Yes; not quantified
Pits number < 5 nr
Surface Quality
Silicon face finish3 nm < 0.5 Mirror
Carbon face finish3 nm ≤ 5 Mirror
Metal Contamination4
(Al, Cr, Fe, Ni, Cu, Zn, Hg, Na*, K, Ti, Ca & Mg)
atoms/cm2 ≤ 1e+11 (except LDL for Al & Na as noted) R
Contamination % None R
Particle Contamination number
Packaging & Misc
Lasermark
Packaging Multi-wafer cassette (single wafer coin container upon request for orders < 3 wafers) Multi-wafer cassette
C of A Yes Yes
Data Package Yes

Legend: R = reported, but specification not; nr = data not reported; na = not applicable

  1. 1 Total useable area calculation includes Candela measurements for surface defects and micropipes to determine an accurate "% useable area calculation". Inspection area on a 2 x 2 mm grid with 3 mm EE.
  2. 2 Dislocation distribution is determined by KOH etching using a 69 point radial measurement technique on 1 wafer per boule.
  3. 3 Not 100% inspected. AFM-RMS warranted using value from 10 x 10 μm scan site.
  4. 4 TXRF LDL for Al and Na is ≤ 5e+11. * denote Al and Na with lower detection limit.

Research Applications

Ultra-Thin Silicon Wafers: Used for PVD coating and flexible electronics. Available as thin as 2 microns.

100mm (4 inch) Wafers: The standard for university labs. Available in Float Zone (FZ) and Czochralski (Cz).

Float Zone (FZ) Wafers: High resistivity, ideal for solar cell processing and surface passivation studies.

Researchers' Trusted Silicon Wafer Manufacturer Since 1997

Logos of University and Government Clients

UniversityWafer, Inc. fills the need for high-quality semiconductor wafers and substrates, from Al2O3 to ZnO. Buy as few as one wafer. Open 24/7.