150mm Silicon Wafers

university wafer, a researcher's best friend
University Silicon Wafer for Production

Get Your Quote FAST!


 

150mm (6 Inch) Silicon Wafers

We have a large selection of 150mm Si wafers in stock and ready to ship. Please fill out the form if you need other specs and quantity.

Item Dia Type Dopant Orien Res (Ohm-cm) Thick (um) Polish Grade Description
478 150mm N/A 650um SSP MECH Low cost Si Wafer great for spin coating.
857 150mm P B <100> 0-10 620 um SSP Test Test Grade Silicon great for wafer processing studies.
1025 150mm N <100> 0-100 625um SSP Test 6" diameter (150mm), silicon wafers, N-type.
2880 150mm P B <100> 0.006-0.012 525um SSP Test With Oxide Back Seal
3071 150mm P B <100> 1-100 500um SSP Test 2 SEMI-STD FLATS WHERE THE PRIMARY FLAT IS <110>
3175 150mm P B <111> 0-0.003 525um SSP Test No Certificate available, wafers sold "As-Is".

 

Item Qty in Material Orient. Diam Thck Surf. Resistivity Comment
Stock (mm) (μm) Ωcm
1383 23 Undoped [100] 6" 650um SSP FZ >10,000 ohm-cm  
2476 100 N/P [100] 6" 675um SSP FZ 2,000-10,000ohm-cm Prime Grade, Float Zone (FZ)
857 500 p-type Si:B [100] 6" 625um P/E 0-100 ohm-cm Test Grade with flat
478 500 TYPE-ANY ANY 6" 625um P/E Resistivity-ANY Mech Grade with flat
2312 125 P/B [100] 6" 675um P/E 0.01-0.02 ohm-cm With EPI layer, Hard wetblast/LTO L.M.
2305 73 P/B [100] 6" 725um P/E 14-22 ohm-cm sd-soft laser mark
2306 120 P/B [100] 6" 635-715um P/E 10-30 ohm-cm 1 semi std. flat 
2307 75 P/B [100] 6" 650-700um P/E 10-30 ohm-cm 2 semi std flats 
2308 570 P/B [100] 6" 610-640um P/E 0.008-0.02 ohm-cm WITH EPI layer, poly bagged & labeled silicon wafers
2309 48 P/B [100] 6" 650-690um P/E 100-200 ohm-cm  
2310 425 N/P [100] 6" 625um P/E 56-72.5 ohm-cm Poly-SI
2311 100 P/B [100] 6" 675um P/E 15-25 ohm-cm Poly-SI L.M.
UW1972 86 N/Phos [100] 6" 320um P/E 2000-8000 ohm-cm Prime Grade, Float Zone (FZ)
E869 25 p--type Si:B [100] 6" 675 P/P FZ 10,000--20,000 SEMI Prime, 1Flat (57.5mm), Empak cst
5869 25 p--type Si:B [100] 6" 675 P/P FZ 5,000--20,000 SEMI Prime, 1Flat (57.5mm), Empak cst
6123 8 p--type Si:B [100] 6" 350 P/P FZ 2,700--3,250 SEMI Prime, 1Flat (57.5mm), Empak cst
G503 44 p--type Si:B [100] 6" 900 C/C FZ >50 SEMI Prime, 1Flat, MCC Lifetime>6,000μs, Empak cst
E239 1 n--type Si:P [100] 6" 825 C/C FZ 7,000--8,000 {7,025--7,856} SEMI, 1Flat, Lifetime=7,562μs, in Open Empak cst
E700 10 n--type Si:P [100--6° towards[111]] ±0.5° 6" 675 P/P FZ >3,500 SEMI Prime, 1Flat (57.5mm), Empak cst
F700 5 n--type Si:P [100--6° towards[111]] ±0.5° 6" 790 ±10 C/C FZ >3,500 SEMI, 1Flat, Empak cst
4982 19 n--type Si:P [100--6° towards[111]] ±0.5° 6" 675 P/P FZ >1,000 SEMI Prime, Notch on <010> {not on <011>}, Laser Mark, Empak cst
D982 1 n--type Si:P [100--6° towards[111]] ±0.5° 6" 675 BROKEN FZ >1,000 SEMI notch Test, Empak cst, Broken into many large pieces. One piece ~50% of wafers other pieces ~20% of wafer
5325 5 n--type Si:P [100] 6" 725 P/P FZ 50--70 {57--62} SEMI Prime, 1Flat (57.5mm), Lifetime=15,799μs, Empak cst
E325 5 n--type Si:P [100] 6" 725 P/P FZ 50--70 SEMI Prime, 1Flat (57.5mm), Empak cst
N445 7 n--type Si:P [112--5.0° towards[11--1]] ±0.5° 6" 875 ±10 E/E FZ >3,000 SEMI, 1Flat (47.5mm), TTV<4μm, Surface Chips
G343 25 n--type Si:P [112--5° towards[11--1]] ±0.5° 6" 1,000 ±10 C/C FZ >3,000 SEMI, 1 JEIDA Flat (47.5mm), Empak cst, TTV<4μm, Lifetime>1,000μs
5822 3 Intrinsic Si:-- [100] 6" 575 P/P FZ >10,000 SEMI Prime, 1Flat (57.5mm), MCC Lifetime>1,200µs, Empak cst
6178 4 Intrinsic Si:-- [100] 6" 675 P/P FZ >10,000 SEMI notch Prime, Empak cst
E179 1 Intrinsic Si:-- [111] ±0.5° 6" 750 E/E FZ >10,000 SEMI notch, TEST (defects, cannot be polished out), Empak cst
G458 5 p--type Si:B [110] ±0.5° 6" 390 ±10 C/C >10 Prime, 2Flats, Empak cst
3882 35 p--type Si:B [100] 6" 675 P/E 50--150 SEMI Prime, 1Flat (57.5mm), Empak cst
6287 300 p--type Si:B [100] 6" 675 P/E 5--10 SEMI Prime, 1Flat (57.5mm), Empak cst
5929 6 p--type Si:B [100] 6" 400 P/P 1--30 SEMI Prime, 1Flat (57.5mm), Empak cst, TTV<5μm
5686 8 p--type Si:B [100] 6" 415 ±15 P/P 1--30 SEMI Prime, 1Flat (57.5mm), Empak cst
5354 6 p--type Si:B [100--9.7° towards[001]] ±0.1° 6" 525 P/P 1--100 SEMI Prime, 1Flat (57.5mm), Empak cst
S5838 12 p--type Si:B [100] ±1° 6" 575 P/P 1--20 SEMI Prime, 1Flat (57.5mm), Empak cst, TTV<2μm
O698 12 p--type Si:B [100] 6" 675 P/P 1--100 SEMI Test, Both sides dirty and scratched, 1Flat, Empak cst
5421 25 p--type Si:B [100] 6" 675 P/E 1--10 {4.5--6.5} SEMI notch Prime, Empak cst, TTV<7μm
N698 12 p--type Si:B [100] 6" 675 P/E 1--100 SEMI Prime, 1Flat, Empak cst
5733 28 p--type Si:B [100] 6" 750 ±10 E/E 1--5 SEMI, 1Flat, Soft cst
6049 5 p--type Si:B [100] 6" 2,000 P/P 1--35 SEMI Prime, 1Flat (57.5mm), Empak cst
6096 8 p--type Si:B [100] 6" 400 ±15 P/P 0.5--1.0 SEMI Prime, 1Flat (57.5mm), Empak cst
S5834 4 p--type Si:B [100] 6" 365 ±10 E/E 0.01--0.02 SEMI Prime, 1Flat (57.5mm), TTV<2μm, Empak cst
F770 4 p--type Si:B [100--6° towards[111]] ±0.5° 6" 675 P/P 0.01--0.02 SEMI Prime, 1Flat (57.5mm), Empak cst, Both sides with scratches
E770 12 p--type Si:B [100--6° towards[111]] ±0.5° 6" 675 P/E 0.01--0.02 SEMI Prime, 1Flat (57.5mm), Empak cst, Both sides polished but only front is Prime
Y206 11 p--type Si:B [100] 6" 675 P/E 0.01--0.02 SEMI Prime, 1Flat (57.5mm), Empak cst
6005 3 p--type Si:B [100] 6" 320 P/E 0.001--0.030 JEIDA Prime, Empak cst
D005 10 p--type Si:B [100] 6" 320 P/E 0.001--0.030 JEIDA Prime, Empak cst
6237 100 p--type Si:B [100] 6" 675 P/P 0.001--0.005 SEMI, 1Flat (57.5mm), Empak cst
9023 21 p--type Si:B [111--4.0°] ±0.5° 6" 625 P/E 4--15 {7.1--8.8} SEMI Prime, 1 JEIDA Flat(47.5mm), Empak cst
I324 100 n--type Si:P [100] 6" 725 P/P 5--35 SEMI Prime, 1 JEIDA Flat(47.5mm), TTV<2μm, TIR<1μm, Bow<10μm, Warp<20μm, With Laser Mark, Empak cst
5814 100 n--type Si:P [100] 6" 925 ±15 E/E 5--35 JEIDA Prime, Empak cst, TTV<5μm
5728 24 n--type Si:P [100] 6" 675 P/E 2.7--4.0 SEMI Prime, in Empak cassettes of 24 wafers
B728 13 n--type Si:P [100] 6" 675 P/E 2.7--4.0 SEMI Prime, in Empak cassettes of 6 & 7 wafers
S5837 25 n--type Si:P [100] 6" 250 ±5 P/P 1--3 SEMI Prime, 1Flat (57.5mm), TTV<2μm, Empak cst
S5644 18 n--type Si:P [100--4° towards[110]] ±0.5° 6" 675 P/E 1--25 SEMI Prime, 1Flat(57.5mm), Empak cst
S5913 1 n--type Si:P [100] ±1° 6" 800 P/E 1--10 SEMI Prime, 1Flat(57.5mm), Empak cst
F859 46 n--type Si:P [100--25° towards[110]] ±1° 6" 800 C/C 1--100 SEMI notch Prime, Empak cst
E089 2 n--type Si:P [100] 6" 1,910 ±10 P/P 1--100 SEMI Prime, 1Flat (57.5mm), Individual cst, TTV<2μm
F089 1 n--type Si:P [100] 6" 1,910 ±10 P/P 1--100 SEMI Prime, 1Flat (57.5mm), Individual cst, TTV<5μm
H727 4 n--type Si:P [100] 6" 3,000 P/P 1--100 SEMI Prime, 1Flat (57.5mm), Empak cst
M176 3 n--type Si:P [100] 6" 5,000 P/P 1--25 Prime, NO Flats, Individual cst
5252 12 n--type Si:Sb [100--6° towards[110]] ±0.5° 6" 675 P/P 0.01--0.02 SEMI Prime, 1Flat (57.5mm), Empak cst
C673 170 n--type Si:Sb [100] 6" 675 P/E 0.008--0.020 SEMI Prime, 1Flat (57.5mm), Empak cst
2533 2 n--type Si:As [100] 6" 1,000 L/L 0.0033--0.0037 SEMI, 1Flat(57.5mm), in individual wafer cassettes
E533 1 n--type Si:As [100] 6" 1,000 L/L 0.0033--0.0037 SEMI, 1Flat(57.5mm), in individual wafer cassettes
4204 89 n--type Si:As [100] 6" 675 P/EOx 0.001--0.005 SEMI Prime, 1Flat (57.5mm), Empak cst, backside LTO 0.6um, TTV<3μm, Bow/Warp<15μm
5541 218 n--type Si:P [100] 6" 675 P/EOx 0.001--0.002 SEMI Prime, 1Flat (57.5mm), with strippable Epi layer Si:P (0.32--0.46)Ohmcm, 3.20±0.16μm thick, Empak cst
D339 20 n--type Si:P [111] ±0.5° 6" 675 P/E 1--100 SEMI Prime, NO Flats, Empak cst
1660 19 n--type Si:As [100] 6" 675 OxP/EOx 0.001--0.005 SEMI TEST (spots & minor visual defects), 1Flat (57.5mm), Thermal Oxide 0.1μm±5% thick, Empak cst
H503 50 p--type Si:B [100] 6" 735 P/P FZ >50 Prime, 1Flat, Empak cst, TTV<2μm
K343 25 n--type Si:P [112--5° towards[11--1]] ±0.5° 6" 800 ±10 P/P FZ >3,000 SEMI, 1 JEIDA Flat (47.5mm), Empak cst, TTV<4μm, Lifetime>1,000μs
L343 25 n--type Si:P [112--5° towards[11--1]] ±0.5° 6" 950 ±10 P/P FZ >3,000 SEMI, 1 JEIDA Flat (47.5mm), Empak cst, TTV<4μm, Lifetime>1,000μs
H178 2 Intrinsic Si:-- [100] 6" 675 P/P FZ >10,000 SEMI notch Prime, Empak cst
G264 3 p--type Si:B [100] 6" 675 P/P 1--5 SEMI Prime, 1Flat, Soft cst