(111) Silicon Wafer Orientation

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(111) Silicon Wafers

Please see below for just a short list of the (110) Silicon Substrates that we have in stock and ready to ship. If you don't see what you need then please email us your specs.

Diam Material Orient. Thck Surf. Resistivity Comment
(mm) Dopant (μm) Ωcm
6" n-type Si:P [111] ±0.5° 300 ±15 P/P FZ >6,000 SEMI Prime, 1Flat (57.5mm), Lifetime>1,000μs, Empak cst
6" n-type Si:P [111] ±0.5° 300 ±15 P/P FZ >6,000 SEMI Prime, 1Flat (57.5mm), Lifetime>1,000μs, Empak cst
6" Intrinsic Si:- [111] ±0.5° 750 E/E FZ >10,000 SEMI notch, TEST (defects, cannot be polished out), Empak cst
6" p-type Si:B [111--4.0°] ±0.5° 625 P/E 4--15 {7.1--8.8} SEMI Prime, 1 JEIDA Flat(47.5mm), Empak cst
6" n-type Si:P [111] ±0.5° 675 P/E 1--100 SEMI Prime, NO Flats, Empak cst
6" Intrinsic Si:- [111] ±0.5° 675 C/C FZ >10,000 SEMI notch, Empak cst
5" n-type Si:P [111] ±0.1° 200 ±15 BROKEN FZ >3,000 Broken L/L wafers, in 2 pieces
5" n-type Si:P [111] 300 ±15 P/E FZ 1,000--3,000 SEMI Prime, in hard cassettes of 8 wafers
5" n-type Si:Sb [111--3.0°] ±0.5° 625 P/E 0.015--0.020 {0.0152--0.0185} SEMI Prime, 2Flats, Empak cst
4" p-type Si:B [111] ±0.5° 400 ±15 P/E FZ >20,000 SEMI Prime, 1Flat, Empak cst, TTV<5μm, Lifetime>1,000μs
4" p-type Si:B [111] ±0.5° 397 P/E FZ 10,000--15,000 SEMI Prime, Backside ACID Etched, Empak cst
4" n-type Si:P [111] ±0.25° 675 P/E FZ 10,000--20,000 SEMI TEST (Light scratches), 1Flat, Lifetime>1,000μs, Empak cst,
4" n-type Si:P [111] ±0.5° 500 P/E FZ 10,000--15,000 SEMI Prime, 1Flat, Empak cst, TTV<5μm
4" n-type Si:P [111] ±0.5° 675 P/E FZ >7,000 SEMI, 1Flat, in Empak, Lifetime>1,600μs
4" n-type Si:P [111] ±0.5° 675 P/E FZ >7,000 SEMI TEST (Scratches, in Unsealed Empak cassette), 1Flat, Lifetime>1,600μs
4" n-type Si:P [111] ±0.5° 675 P/E FZ >7,000 SEMI, 1Flat, Lifetime>1,600μs, in Empak cassettes of 6 and 8 wafers
4" n-type Si:P [111] ±0.5° 630 P/G FZ >7,000 SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs, Back--side Fine Ground
4" n-type Si:P [111] ±0.25° 675 P/E FZ 7,000--10,000 SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs, Light scratches
4" n-type Si:P [111] ±0.5° 150 ±10 BROKEN FZ 5,000--10,000 Broken P/E wafers, in Empak
4" n-type Si:P [111] ±0.25° 675 P/E FZ 5,000--7,000 SEMI Prime, 1Flat, in Empak, Lifetime>1,000μs
4" n-type Si:P [111] ±0.25° 675 P/E FZ 5,000--7,000 SEMI TEST (light scratches), 1Flat, Lifetime>1,000μs, in Empak
4" n-type Si:P [111] ±0.5° 525 P/E FZ >5,000 SEMI Prime, 1Flat, Lifetime>1,000μs, Empak cst
4" n-type Si:P [111--1° towards[110]] ±0.5° 525 P/E FZ >5,000 SEMI TEST (scratches on back--side), 1Flat, Empak cst
4" n-type Si:P [111] ±0.25° 525 P/E FZ 3,000--5,000 SEMI TEST (light scratches), 1Flat, Empak cst
4" n-type Si:P [111] ±0.25° 525 P/E FZ 3,000--5,000 SEMI Prime, 1Flat, in Empak cassettes of 3, 3 & 4 wafers
4" n-type Si:P [111] ±0.5° 525 P/P FZ >3,000 SEMI Prime, 2Flats, Lifetime>1,000μs, Empak cst
4" n-type Si:P [111] ±0.5° 525 P/P FZ >3,000 SEMI Prime, 2Flats, Lifetime>1,000μs, in Empak cassettes of 5, & 10 wafers
4" n-type Si:P [111] ±0.5° 525 P/P FZ >3,000 SEMI Prime, 1Flat (32.5mm)
4" n-type Si:P [111] ±0.5° 285 ±10 P/P FZ 2,500--2,700 SEMI Prime, 2Flats, Empak cst
4" n-type Si:P [111] ±0.5° 290 ±10 P/P FZ 2,500--3,500 SEMI TEST (Surface defects), 2Flats, Empak cst
4" n-type Si:P [111] ±1° 380 P/E FZ 2,000--3,000 SEMI Prime, 1Flat, TTV<5μm, Lifetime>1,000μs, in Epak cassettes of 6 wafers
4" n-type Si:P [111] ±0.5° 525 P/E FZ 1,500--3,000 SEMI Prime, 1Flat, in Empak, Lifetime>1,100μs
4" n-type Si:P [111] ±0.5° 525 P/E FZ 430--550 SEMI Prime, 1Flat, Empak cst, TTV<7μm
4" n-type Si:P [111] ±0.5° 525 P/E FZ 430--550 SEMI Prime, 1Flat, Empak cst, TTV<7μm
4" n-type Si:P [111] ±0.5° 500 ±13 E/E FZ 6.03--7.37 SEMI, 2Flats
4" Intrinsic Si:- [111] ±0.5° 500 P/P FZ >25,000 SEMI Prime, 1Flat, Empak cst
4" Intrinsic Si:- [111] ±0.5° 300 P/E FZ 20,000--40,000 SEMI, 1Flat, TTV<5μm, Empak cst
4" Intrinsic Si:- [111] ±0.5° 500 P/E FZ >20,000 SEMI Prime, 1Flat, Empak cst, Extra 3 free non--prime wafers included with 4 prime wafers
4" Intrinsic Si:- [111] ±0.5° 450 P/P FZ >20,000 SEMI Prime, 1Flat, Empak cst
4" Intrinsic Si:- [111] ±0.5° 500 P/P FZ >10,000 SEMI Prime, 1Flat, Empak cst
4" p-type Si:B [111] 350 P/E 2--3 Prime, NO Flats, Empak cst
4" p-type Si:B [111] ±0.5° 1,000 P/E 1--10 SEMI Prime, 1Flat, in hard cassettes of 7 & 8 wafers
4" p-type Si:B [111] 1,000 P/P 1--10 SEMI Prime, 1Flat, Empak cst, Cassettes of 10 and 10 wafers
4" p-type Si:B [111] 1,000 P/P 1--10 SEMI Prime, 1Flat, Empak cst
4" p-type Si:B [111] ±0.5° 525 P/P 0.2--1.0 SEMI Prime, 1Flat, in Empak cassettes of 6, 7 & 7 wafers
4" p-type Si:B [111--4°] ±0.5° 525 P/E 0.01--0.02 SEMI Prime, 1Flat, Empak cst
4" p-type Si:B [111--4°] ±0.5° 525 ±15 P/EOx 0.005--0.015 {0.0086--0.0135} SEMI Prime, 1Flat, Empak cst, TTV<5μm, 5,000A LTO on back--side
4" p-type Si:B [111--3°] ±0.5° 525 P/E 0.002--0.016 SEMI Prime, 1Flat, in Empak cassettes of 4, 5 & 5 wafers
4" p-type Si:B [111--3°] 525 P/E 0.002--0.004 SEMI Prime, 1Flat, Empak cst
4" ShowShoppingCartTally(); p-type Si:B [111] ±0.5° 1,000 P/E <0.01 SEMI Prime, 1Flat, Empak cst