Fourier Transform Infrared (FTIR) Measurement

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Silicon Wafers Used in FTIR Meaurements

Below are just some recent silicon wafer specs used by our clients for FTIR Measurments. They are high-quality, inexpensive substrates.

Si Item #1583 - 100mm P/B <100> 0.001-0.005 ohm-cm 500um SSP Prime with 300nm of Thermal Oxide

Si Item #452 - 100mm P/B <100)> 0-100 ohm-cm 500um SSP Test Grade

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