200mm Silicon Wafers for Research & Production 

UniversityWafer, Inc. supplies a wide range of 200mm (8-inch) silicon wafers for device fabrication, equipment calibration, and materials research. Researchers choose 200mm wafers as a cost-effective bridge between 150 mm and 300 mm wafer lines, with Prime, Test, and Mechanical grades available in ⟨100⟩ and ⟨111⟩ orientations, multiple dopants, and both SSP and DSP polish options.

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Buy 200mm (8-Inch) Silicon Wafers Online

200mm 8-inch doped silicon wafers UniversityWafer supplies a broad selection of silicon wafers in the 200mm, or 8-inch, diameter format. Available options may include prime-grade, test-grade, mechanical-grade, Czochralski-grown, and Float Zone silicon wafers for semiconductor fabrication, equipment testing, thin-film deposition, MEMS, lithography, spin coating, and materials research.

In-stock wafers can often ship quickly in research and production quantities. For custom specifications, provide the required grade, orientation, dopant, resistivity, thickness, polish, quantity, and application in the quote form below.

Example 200mm Silicon Wafer Specifications

  • Diameter: 200 ± 0.5mm
  • Conductivity: P-type silicon
  • Crystal orientation: <100>
  • Resistivity: 1,000–3,000Ω·cm
  • Thickness: 705–745µm
  • Edge identification: V-notch
  • Surface: Polished/etched
  • Packaging: 25 wafers per cassette in a sealed foil bag

Specifications and availability change frequently. Contact us for current inventory, small-quantity availability, custom processing, or volume pricing.

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200mm Silicon Wafers for Magnetic-Field Research

Silicon substrates may be used in experiments involving strong or pulsed magnetic fields, including Hall-effect measurements, magnetotransport studies, quantum-device research, thin-film characterization, and sensor fabrication. The magnetic field does not produce the wafer or perform the sputtering process; instead, researchers expose a fabricated semiconductor sample to the field and measure changes in its electrical behavior.

Silicon wafer research in pulsed high magnetic fields

Important wafer properties for magnetic-field experiments may include conductivity type, carrier concentration, mobility, resistivity, crystal orientation, wafer thickness, surface finish, and dopant uniformity. High-resistivity or Float Zone silicon may be preferred when low impurity levels, low parasitic conduction, or long carrier lifetime are important.

Thin films such as metals, dielectrics, magnetic materials, graphene, or other semiconductor layers may be deposited on the silicon before the sample is patterned and tested. Suitable deposition methods include sputtering, evaporation, chemical vapor deposition, and atomic layer deposition.

200mm Silicon Wafers for Polymer Spin Coating

The flat, circular surface of an 8-inch silicon wafer makes it a useful substrate for spin coating photoresists, polyimides, SU-8, polymers, sol-gel materials, and other liquid films. Spin coating distributes a liquid across the wafer using centrifugal force to create a thin and relatively uniform coating.

The most appropriate wafer grade depends on the purpose of the experiment. Test-grade silicon wafers and mechanical-grade wafers may be economical choices for coating trials, equipment setup, process training, and non-device tests. Prime-grade wafers are generally preferred for photolithography, fine patterning, and experiments where surface defects or particles could affect the results.

Important Specifications for Spin Coating

  • Surface finish: SSP or DSP
  • Surface condition: Clean, polished, and low in particles
  • Flatness: Suitable bow, warp, and total thickness variation
  • Thickness: Compatible with the chuck and handling system
  • Edge profile: Appropriate for secure vacuum-chuck contact
  • Wafer grade: Prime, test, reclaim, or mechanical
  • Surface film: Bare silicon, thermal oxide, nitride, or another coating

Coating uniformity can be influenced by spin speed, acceleration, solution viscosity, dispense volume, solvent evaporation, wafer temperature, surface energy, and wafer topography. Features such as trenches, steps, or patterned structures may cause material to accumulate in recessed areas or become thinner near raised edges.

Recommended Wafer Options

Researchers commonly select the following 200mm substrates for coating experiments:

  • Mechanical-grade 200mm silicon, approximately 750µm thick, SSP
  • Test-grade 200mm silicon for photoresist and polymer process development
  • Prime-grade 200mm silicon for lithography and device fabrication
  • Thermal oxide silicon wafers for dielectric or surface-chemistry studies
  • Thin silicon wafers for flexible-device, backside-processing, or packaging research

For repeatable coating results, use wafers with consistent thickness, polish, surface preparation, and dimensional tolerances across each experimental batch.

Choosing CZ or Float Zone 200mm Silicon

Most standard 200mm wafers are produced using the Czochralski growth method. CZ silicon is widely available in many dopant, resistivity, orientation, and polish options, making it suitable for integrated circuits, MEMS, thin-film deposition, oxidation, lithography, and general semiconductor research.

Float Zone silicon generally contains less oxygen and carbon and is available in high-resistivity specifications. It may be selected for radiation detectors, RF devices, power electronics, high-field experiments, and other applications requiring high-purity silicon.

Related Wafer Sizes and Materials

Researchers evaluating 200mm silicon substrates may also compare:

What Are 200mm Silicon Wafers Used For?

200mm silicon wafers, also called 8-inch silicon wafers, are widely used for semiconductor research, pilot production, equipment qualification, process development, and commercial device fabrication. Their large usable surface area allows many dies, sensors, or test structures to be fabricated on a single wafer while remaining compatible with established 200mm semiconductor equipment.

UniversityWafer supplies silicon wafers in prime, test, reclaim, and mechanical grades with a variety of dopants, resistivities, crystal orientations, thicknesses, and surface finishes.

Common applications for 200mm wafers include:

  • Integrated circuits and CMOS devices — microcontrollers, analog circuits, power-management devices, memory components, and mature-node semiconductor products.
  • MEMS fabrication — accelerometers, pressure sensors, microphones, actuators, resonators, and microfluidic devices.
  • Power electronics — MOSFETs, diodes, insulated-gate devices, and high-voltage semiconductor structures.
  • Optoelectronics — image sensors, photodetectors, optical test structures, and silicon photonic devices.
  • Thin-film research — sputtering, evaporation, chemical vapor deposition, atomic layer deposition, and polymer spin coating.
  • Equipment testing — process-tool calibration, wafer handling, chuck testing, deposition uniformity studies, and automated inspection.

Why Choose 200mm Wafers?

A 200mm wafer provides substantially more usable surface area than a 150mm silicon wafer, while generally requiring less expensive tooling and infrastructure than a 300mm silicon wafer. This makes the 8-inch format especially useful for mature semiconductor processes, university cleanrooms, pilot lines, MEMS foundries, and specialty-device manufacturers.

The 200mm format is also supported by a large installed base of lithography, oxidation, diffusion, deposition, etching, metrology, and wafer-handling equipment.

200mm Silicon Wafer Grades

The appropriate wafer grade depends on the device, process step, and required surface quality. UniversityWafer can help researchers select among the following common options:

Prime-Grade 200mm Silicon Wafers

Prime-grade wafers are used for demanding semiconductor fabrication where low particle levels, tight dimensional tolerances, excellent flatness, and a high-quality polished surface are required. They are commonly selected for photolithography, device fabrication, epitaxy, oxidation, thin-film deposition, and advanced research.

Test-Grade 200mm Silicon Wafers

Test-grade silicon wafers provide a cost-effective substrate for process development, equipment calibration, deposition trials, wafer handling, spin coating, and non-device experiments.

Mechanical-Grade and Reclaim Wafers

Mechanical-grade and reclaim wafers are frequently used for tool setup, robotic handling tests, chamber seasoning, thermal-process trials, sputtering, training, and applications where electronic-grade surface quality is not required.

Common 200mm Silicon Wafer Specifications

Standard and custom 8-inch silicon wafer specifications may include:

  • Diameter: 200mm, commonly specified with a tight diameter tolerance
  • Thickness: approximately 650–750µm for standard wafers
  • Crystal orientation: <100> or <111>
  • Conductivity type: p-type, n-type, or undoped
  • Dopants: boron, phosphorus, arsenic, or antimony
  • Resistivity: heavily doped through high-resistivity ranges
  • Surface finish: single-side polished (SSP) or double-side polished (DSP)
  • Edge identification: notch, typically a V-notch for 200mm wafers
  • Growth method: Czochralski (CZ), magnetic Czochralski, or Float Zone (FZ)
  • Optional films: thermal oxide, silicon nitride, metals, or deposited dielectric layers

Thin 200mm Silicon Wafers

Thin 200mm silicon wafers are available for research involving flexible electronics, power devices, MEMS, backside processing, wafer bonding, packaging, thermal management, and weight-sensitive systems.

Common custom thickness requests include:

  • 75µm
  • 100µm
  • 125µm
  • 150µm
  • Other custom thicknesses upon request

Thin wafers require careful handling because reduced thickness increases the risk of bow, breakage, edge damage, and handling-tool incompatibility. Temporary bonding, specialty carriers, or protective packaging may be recommended for some processes.

200mm Silicon Wafers for Polymer Spin Coating

200mm silicon wafers are commonly used as substrates for spin coating photoresists, polyimides, SU-8, polymers, sol-gel materials, and other liquid films. A flat, uniformly polished surface helps produce consistent film thickness across the wafer.

Mechanical-grade or test-grade wafers may be suitable for early coating trials, while prime-grade wafers are generally preferred when surface defects, particles, flatness, or coating uniformity can affect the final result.

Important spin-coating wafer specifications include:

  • Wafer diameter and thickness
  • Single-side or double-side polish
  • Surface roughness
  • Total thickness variation (TTV)
  • Bow and warp
  • Edge profile and notch position
  • Surface cleanliness and particle count
  • Compatibility with the spin-coater chuck

Researchers can buy 200mm silicon wafers online or request custom specifications for polymer and photoresist coating experiments.

Measuring Carrier Concentration and Mobility

Carrier concentration and carrier mobility are important electrical properties of doped silicon. They influence wafer resistivity, conductivity, device switching behavior, current flow, and overall semiconductor performance.

Electrical and thickness mapping of a 200mm silicon wafer

Common characterization methods include:

  • Hall-effect measurement — determines carrier type, sheet carrier concentration, and mobility.
  • Four-point probe measurement — measures sheet resistance without relying on contact resistance from a two-probe configuration.
  • Spreading resistance profiling — evaluates resistivity or dopant concentration as a function of depth.
  • Contactless resistivity mapping — measures wafer-level resistivity uniformity without fabricating permanent electrical contacts.
  • Capacitance-voltage testing — evaluates semiconductor doping and dielectric-interface properties in fabricated test structures.

Measurements may be taken at the center and at multiple radial locations to evaluate wafer uniformity. The appropriate method depends on the resistivity range, sample geometry, wafer thickness, surface condition, and whether the wafer contains deposited films.

200mm Silicon Wafers for Hall-Effect Research

Hall-effect experiments require more than selecting a wafer by diameter alone. Researchers should specify the electrical and physical properties that influence carrier transport and measurement accuracy.

Important specifications may include:

  • p-type or n-type conductivity
  • Dopant species
  • Target resistivity or carrier concentration
  • Crystal orientation
  • Wafer thickness
  • Single-side or double-side polish
  • Surface roughness and cleanliness
  • Radial resistivity uniformity
  • Required test-piece geometry
  • Ohmic contact or metallization requirements
Hall-effect measurement diagram for silicon semiconductor research

Full 200mm wafers may be used when wafer-scale mapping or compatibility with automated equipment is required. For conventional Hall measurements, however, the wafer is often diced into smaller square, rectangular, cross-shaped, or van der Pauw test samples before contacts are deposited.

UniversityWafer can provide full wafers or custom-diced silicon substrates for Hall-effect, conductivity, dopant, and semiconductor transport studies.

200mm Float Zone Silicon Wafers

Float Zone silicon wafers are manufactured using a localized molten zone that travels through a high-purity silicon rod. Because the process does not use a quartz crucible, FZ silicon generally contains less oxygen than conventional Czochralski-grown silicon.

Float Zone growth and fabrication process for 200mm silicon wafers

High-purity FZ silicon is frequently selected for high-resistivity substrates, power electronics, radiation detectors, RF devices, particle detectors, precision sensors, and scientific instrumentation.

Advantages of Float Zone silicon may include:

  • Very low oxygen and carbon concentrations
  • High bulk purity
  • High-resistivity options
  • Long minority-carrier lifetime
  • Low defect and contamination levels
  • Suitability for sensitive detector and power-device applications

Although smaller-diameter FZ wafers are more common, 200mm Float Zone silicon may be available in selected specifications. Diameter, resistivity, orientation, thickness, dopant, and quantity should be included when requesting a quote.

200mm Czochralski Silicon Wafers

Czochralski-grown silicon is the most widely available material for standard 200mm wafer production. During CZ growth, a seed crystal is withdrawn from molten silicon contained in a quartz crucible, producing a cylindrical single-crystal ingot.

CZ wafers are commonly used for integrated circuits, MEMS, sensors, power devices, thermal oxidation, thin-film deposition, lithography, and general semiconductor research. They are typically more readily available and economical than equivalent large-diameter Float Zone wafers.

200mm CZ vs. FZ Silicon

Property Czochralski Silicon Float Zone Silicon
Availability Widely available in 200mm More limited at 200mm
Oxygen Content Higher due to quartz crucible growth Very low
Resistivity Range Broad standard range Excellent for high-resistivity material
Typical Applications ICs, MEMS, sensors, general fabrication Power devices, detectors, RF, scientific research
Relative Cost Generally lower Generally higher

How to Select a 200mm Silicon Wafer

When requesting a quote, provide as many of the following specifications as possible:

  • Quantity
  • Prime, test, reclaim, or mechanical grade
  • CZ or FZ growth method
  • <100> or <111> orientation
  • p-type, n-type, or undoped silicon
  • Dopant species
  • Target resistivity
  • Wafer thickness
  • SSP or DSP surface finish
  • TTV, bow, warp, and flatness requirements
  • Particle or surface-quality requirements
  • Thermal oxide, nitride, metal, or other deposited films
  • Full wafers or custom-diced pieces

Selecting the correct combination of grade, crystal orientation, resistivity, thickness, and surface finish helps ensure compatibility with your fabrication equipment and research process.

Related 200mm Silicon Wafer Resources

Explore related silicon wafer sizes, grades, growth methods, surface finishes, and specialty substrates for semiconductor fabrication and research.