Subsrates Used In Microanalysis

university wafer substrates

SiC Wafers for Raman Microanalysis

A principal applications scientist requested a quote for the following.

I have been doing Raman microanalysis for a lot of years and am always looking for opportunities to demonstrate its unique possibilities. I have seen pictures of defects in SiC that probably appear during growth. What is interesting about SiC (I am sure that you are aware of this) is that all nearest neighbor interactions are identical in ALL polymorphs which is probably what enables the appearance of multiple phases during growth. I would be quite grateful if you could supply us with such a sample for analysis. I could use the results in an upcoming column in Spectroscopy and give you credit for the sample (or not, depending on your choice). 

Reference #304158 for specs and prcing.

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Substrates Used for Microanalysis

Microanalysis often involves analyzing very small samples to determine their composition or structure. The choice of substrate depends on the specific technique and the nature of the sample. Here are some common substrates used in microanalysis:

  1. Silicon Wafers: Often used in electron microscopy and microelectronic applications. They provide a smooth, flat surface that can be beneficial for imaging and analysis.

  2. Graphite: Used in techniques like X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). It is particularly useful for its conductivity and stability.

  3. Copper and Gold Grids: Employed in transmission electron microscopy (TEM) to support thin samples. The fine mesh allows electrons to pass through the sample with minimal interference.

  4. Silicon Nitride or Silicon Oxide Membranes: Used in TEM and other high-resolution imaging techniques. They provide a thin, stable support for samples while minimizing background interference.

  5. Polymers (e.g., Polycarbonate, Kapton): Often used as support films in TEM or as substrates in surface analysis techniques. They are valued for their flexibility and ease of handling.

  6. Conductive Coatings (e.g., Carbon, Gold): Applied to non-conductive samples to prevent charging during SEM or other electron-based analyses. They provide a conductive layer that helps with imaging and analysis.

  7. Glass Slides: Commonly used in optical microscopy and some surface analysis techniques. They provide a flat, transparent surface for sample observation.

  8. Metal Foils: Used in various analytical techniques, including X-ray diffraction (XRD) and energy-dispersive X-ray spectroscopy (EDS), due to their conductive properties and durability.

The choice of substrate will depend on the specific requirements of the analysis technique, such as the need for conductivity, transparency, or chemical stability.

Microanalysis refers to the examination and analysis of very small samples or features, typically at the microscopic or nanoscopic scale. It aims to determine the composition, structure, or properties of materials on a micro or nanometer scale. This field is crucial in various scientific and industrial applications, including materials science, biology, chemistry, and semiconductor manufacturing. Here’s a breakdown of what microanalysis involves:

Key Aspects of Microanalysis

  1. Sample Size: Microanalysis deals with samples that are often on the order of micrometers (µm) to nanometers (nm) in size. This can include tiny particles, thin films, or small regions within a larger sample.

  2. Techniques: Several specialized techniques are used in microanalysis, including:

    • Scanning Electron Microscopy (SEM): Provides high-resolution images of sample surfaces.
    • Transmission Electron Microscopy (TEM): Offers detailed images and structural information by transmitting electrons through thin samples.
    • X-ray Photoelectron Spectroscopy (XPS): Analyzes the elemental composition and chemical states of surface layers.
    • Energy-Dispersive X-ray Spectroscopy (EDS): Often coupled with SEM to provide elemental composition information.
    • Atomic Force Microscopy (AFM): Measures surface topography at the nanometer scale.
    • Secondary Ion Mass Spectrometry (SIMS): Provides detailed information on the composition and depth profiling of solid surfaces.

  3. Applications:

    • Materials Science: Identifying and characterizing the properties of materials, including metals, polymers, and composites.
    • Semiconductor Manufacturing: Analyzing microelectronic components and devices for quality control and failure analysis.
    • Biology and Medicine: Examining cellular structures, tissues, and small biological samples.
    • Chemistry: Studying chemical compositions and reactions at a micro or nano scale.

  4. Goals:

    • Elemental Analysis: Determining which elements are present in a sample and their concentrations.
    • Structural Analysis: Investigating the arrangement of atoms or molecules within a material.
    • Surface Characterization: Understanding surface features and properties, including roughness and composition.
    • Quality Control: Ensuring the integrity and performance of materials and devices.

Microanalysis is essential for understanding complex materials and processes at a detailed level, providing insights that are not achievable with traditional, macroscopic analysis methods.